Changeset eaff189 in rtems


Ignore:
Timestamp:
Mar 10, 2007, 3:56:13 PM (13 years ago)
Author:
Joel Sherrill <joel.sherrill@…>
Children:
91f9d89
Parents:
32ad50f2
Message:

2007-03-10 Joel Sherrill <joel@…>

PR 1227/bsps

  • include/bsp.h: Remove MAX_LONG_TEST_DURATION and MAX_SHORT_TEST_DURATION. They are obsolete and unused.
Location:
c/src/lib/libbsp
Files:
6 edited

Legend:

Unmodified
Added
Removed
  • c/src/lib/libbsp/powerpc/gen5200/ChangeLog

    r32ad50f2 reaff189  
     12007-03-10      Joel Sherrill <joel@OARcorp.com>
     2
     3        PR 1227/bsps
     4        * include/bsp.h: Remove MAX_LONG_TEST_DURATION and
     5        MAX_SHORT_TEST_DURATION. They are obsolete and unused.
     6
    172007-01-24      Thomas Doerfler <Thomas.Doerfler@embedded-brains.de>
    28
  • c/src/lib/libbsp/powerpc/gen5200/include/bsp.h

    r32ad50f2 reaff189  
    138138
    139139/*
    140  *  Define the time limits for RTEMS Test Suite test durations.
    141  *  Long test and short test duration limits are provided.  These
    142  *  values are in seconds and need to be converted to ticks for the
    143  *  application.
    144  *
    145  */
    146 
    147 #define MAX_LONG_TEST_DURATION       300 /* 5 minutes = 300 seconds */
    148 #define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
    149 
    150 /*
    151140 *  Stuff for Time Test 27
    152141 */
  • c/src/lib/libbsp/sparc/leon2/ChangeLog

    r32ad50f2 reaff189  
     12007-03-10      Joel Sherrill <joel@OARcorp.com>
     2
     3        PR 1227/bsps
     4        * include/bsp.h: Remove MAX_LONG_TEST_DURATION and
     5        MAX_SHORT_TEST_DURATION. They are obsolete and unused.
     6
    172006-12-02      Ralf Corsépius <ralf.corsepius@rtems.org>
    28
  • c/src/lib/libbsp/sparc/leon2/include/bsp.h

    r32ad50f2 reaff189  
    5353#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_OPENETH  rtems_leon_open_eth_driver_attach
    5454#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2
    55 
    56 /*
    57  *  Define the time limits for RTEMS Test Suite test durations.
    58  *  Long test and short test duration limits are provided.  These
    59  *  values are in seconds and need to be converted to ticks for the
    60  *  application.
    61  *
    62  */
    63 
    64 #define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
    65 #define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
    6655
    6756/*
  • c/src/lib/libbsp/sparc/leon3/ChangeLog

    r32ad50f2 reaff189  
     12007-03-10      Joel Sherrill <joel@OARcorp.com>
     2
     3        PR 1227/bsps
     4        * include/bsp.h: Remove MAX_LONG_TEST_DURATION and
     5        MAX_SHORT_TEST_DURATION. They are obsolete and unused.
     6
    172007-02-06      Ralf Corsépius <ralf.corsepius@rtems.org>
    28
  • c/src/lib/libbsp/sparc/leon3/include/bsp.h

    r32ad50f2 reaff189  
    7878#endif
    7979
    80 
    81 /*
    82  *  Define the time limits for RTEMS Test Suite test durations.
    83  *  Long test and short test duration limits are provided.  These
    84  *  values are in seconds and need to be converted to ticks for the
    85  *  application.
    86  *
    87  */
    88 
    89 #define MAX_LONG_TEST_DURATION       3   /* 3 seconds */
    90 #define MAX_SHORT_TEST_DURATION      3   /* 3 seconds */
    91 
    9280/*
    9381 *  Simple spin delay in microsecond units for device drivers.
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